In electron scanning, the scanning motion of the electron beam from left to right is called line scanning or horizontal scanning, and the scanning motion of the electron beam from top to bottom is called frame scanning or vertical scanning.
The two scanning speeds are completely different, the line scanning speed is faster than the frame scanning speed, for the scanning image of 1000 lines, the speed ratio of 1000.
The scanning electron microscope is a large-scale analytical instrument, which is widely used in the observation of a variety of solid substances on the surface of the ultrastructure of the morphology and composition.