Reliability of electronic products: If an electronic product high temperature accelerated aging (75 ℃ environment) 2000 hours, the failure rate of 0%;

It depends on the kind of acceleration model you choose, the magnification you mentioned here is the acceleration factor (AF)

The usual acceleration models are:

1, temperature-humidity effect Hallberg-peck

AF=(RHt/Rhu)^3*exp[(Ea/k)*(1/Tu-1/Tt)]

2. Temperature Effect ArrheniusModel

AF=exp{(Ea/k)*[(1/Tu)-(1/Ts)]}

3. Microcircuit Voltage Acceleration Factor

Afv=exp(β*(Vt-Vu))

Vu=Use Voltage

Vt = test voltage

β=voltage acceleration constant (empirically derived)

Your choice of 2 here, the temperature effect model (Alelianis model), you bring in the corresponding qualities to get the acceleration factor AF