How to do the high and low temperature working test of electronic products, what are the test conditions?

High and low temperature test for electricians, electronic products, components and their materials in the high and low temperature environment, storage, transportation and use of adaptability test, electronic products are able to adapt to harsh environments

Reference standards: GB10592-89, GB10589-89, GB2423.2-89, GB/T5170.2-96 standard

The purpose of the experiment: to see whether the electronic products can be used normally in the harsh environment of high or low temperature

I. High temperature test:

1. The test temperature is the highest working temperature of the test product.

2, to see if the product can be used in the case of high temperature (such as cell phones can start)

3, to see if the product can be charged during the test (such as cell phones in the case of high temperature whether it can be used while charging)

Two, low-temperature test: (with the high-temperature box the same reason)

1, the test temperature is the lowest working temperature for the test product. The test temperature is the lowest working temperature of the test product.

2, to see if the product can be used in the case of low temperature (such as whether the phone can start)

3, to see if the product can be charged during the test test (such as whether the phone can be used while charging at low temperatures)

The test time for the test samples to reach a stable temperature in the non-working state, and then start the test samples for work until the test The temperature of the sample is stabilized or the time of working according to the relevant standards or technical documents.

The purpose of the test to determine the pieces, equipment or other products in the use of high temperature environmental conditions of adaptability. In special cases, if the test sample during the condition test does not reach temperature stability. Then the duration of the test is calculated from the test box (chamber) to reach the specified test temperature.